SEMI Technology Symposium (STS)

S3—Test Technologies

Event Code: Date: Time: Location:

STS—S3 Tuesday, 6 May 2008 09:30–13:15 Level 3, Suntec Singapore

Session Chair: Mr S. Y. Lee Senior Manager, PLM-Test Stats ChipPAC Ltd

	[09:30–10:30] Keynote: Trends, Market Drivers and Outlook – IC Assembly and Test, 2008 and Beyond Mr Michael W. Schraeder Vice President Test Products and Services Stats ChipPAC Inc.
	[10:30–11:00] Semiconductor Failure Analysis for 60 Years and Beyond Mr Xue Ming Senior Manager, Failure Analysis Lab Infineon Technologies
	[11:00–11:30] Parallel RF Testing for Multi-band Transceiver Mr Tan Eng Keong Senior Consultant, Centre of Expertise Verigy Limited
	[11:30–11:45] Break
	[11:45–12:15] Efuse Methodology and Characterization Mr Alan Lek Manager for the Product Engineering Department Chartered Semiconductor Manufacturing Ltd
	[12:15–12:45] RF SoC Testing Ms Jaime Liang Applications Engineer LTX Asia International Inc.
	[12:45–13:15] Probe Designs for Fine Pitch Applications – Kelvin and Wafer-Level Test Mr Jim Brandes Product Manager Everett Charles Technologies

Programmes are subject to change without prior notice.

Seats are available on first-come-first-served basis

Co-sponsored by: